
Field Emission Scanning Electron Microscopy
This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution.
- Undertitel
- New Perspectives for Materials Characterization
- Författare
- Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
- Upplaga
- 1st ed. 2018
- ISBN
- 9789811044328
- Språk
- Engelska
- Vikt
- 310 gram
- Utgivningsdatum
- 2017-10-06
- Sidor
- 137