Electron Beam Analysis of Materials

"Electron Beam Analysis of Materials" describes, in detail, the many electron beam techniques developed for the assessment of microstructure. They include: transmission electron microscopy, scanning electron microscopy, scanning transmission electron microscopy, high resolution electron microscopy, conventional and convergent beam electron diffraction, Auger electron spectroscopy, electron energy loss spectroscopy, electron probe microanalysis of bulk samples and X-ray microanalysis of electron transparent samples. For this edition, the text has been updated throughout and extended to include the computer-control of microscopes and the computer-based solution of the information available from electron microscopes. This book should be of interest to students, researchers and industrial scientists in materials science, metallurgy, solid state physics and chemistry.