Spara
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Författare:
häftad, 2010
Engelska
Final test consists of checking device functionality by exercising RF tests and by applying a comprehensive suite of digital test methods such as I , delay fault testing, DDQ stuck-at testing, low-voltage testing, etc.
- Författare
- Manoj Sachdev, José Pineda de Gyvez
- Upplaga
- Softcover reprint of hardcover 2nd ed. 2007
- ISBN
- 9781441942852
- Språk
- Engelska
- Vikt
- 310 gram
- Utgivningsdatum
- 2010-11-10
- Sidor
- 328
