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CMOS RF Circuit Design for Reliability and Variability
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CMOS RF Circuit Design for Reliability and Variability

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits.
Författare
Jiann-Shiun Yuan
Upplaga
1st ed. 2016
ISBN
9789811008825
Språk
Engelska
Vikt
310 gram
Utgivningsdatum
21.4.2016
Sidor
106