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CMOS Plasma and Process Damage
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CMOS Plasma and Process Damage

Författare:
inbunden, 2025
Engelska
Readers will learn how plasma and process damage results from the high-energy processes that are used in chip manufacturing, causing harm to the chips, functional failure and reliability problems.
Författare
Kirk Prall
ISBN
9783031890284
Språk
Engelska
Vikt
446 gram
Utgivningsdatum
2025-05-17
Sidor
466