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Atomic Force Microscopy Based Nanorobotics
Författare:
inbunden, 2011
Engelska
The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.
- Undertitel
- Modelling, Simulation, Setup Building and Experiments
- Författare
- Hui Xie, Cagdas Onal, Stéphane Régnier, Metin Sitti
- Upplaga
- 2011
- ISBN
- 9783642203282
- Språk
- Engelska
- Vikt
- 446 gram
- Utgivningsdatum
- 2011-09-28
- Sidor
- 344
