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Applied Scanning Probe Methods XII
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Applied Scanning Probe Methods XII

inbunden, 2008
Engelska
Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties.
Undertitel
Characterization
Upplaga
2009 ed.
ISBN
9783540850380
Språk
Engelska
Vikt
446 gram
Utgivningsdatum
2008-11-04
Sidor
224