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Applied Scanning Probe Methods II
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Applied Scanning Probe Methods II

inbunden, 2006
Engelska
These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.
Undertitel
Scanning Probe Microscopy Techniques
ISBN
9783540262428
Språk
Engelska
Vikt
446 gram
Utgivningsdatum
2006-02-21
Sidor
420