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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Författare:
häftad, 2013
Engelska
This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.
- Författare
- Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury
- Upplaga
- Softcover reprint of the original 1st ed. 1986
- ISBN
- 9781475790290
- Språk
- Engelska
- Vikt
- 310 gram
- Utgivningsdatum
- 8.6.2013
- Sidor
- 454
