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Acoustic Scanning Probe Microscopy
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Acoustic Scanning Probe Microscopy

The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave.
Upplaga
2013 ed.
ISBN
9783642430794
Språk
Engelska
Vikt
310 gram
Utgivningsdatum
2014-11-09
Sidor
494