
Scanning Ion Conductance Microscopy
This book provides a selection of recent developments in scanning ion conductance microscopy (SICM) technology and applications.
- Redaktör
- Tilman E. Schäffer
- Upplaga
- 1st ed. 2022
- ISBN
- 9783031144424
- Språk
- Engelska
- Vikt
- 446 gram
- Utgivningsdatum
- 30.9.2022
- Sidor
- 230