Spara
Principles of Analytical Electron Microscopy
inbunden, 1986
Engelska
All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention.
- Redaktör
- Joseph Goldstein, David C. Joy, Alton D. Romig Jr.
- Upplaga
- 1986 ed.
- ISBN
- 9780306423871
- Språk
- Engelska
- Vikt
- 446 gram
- Utgivningsdatum
- 1986-07-31
- Sidor
- 448
