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High Quality Test Pattern Generation and Boolean Satisfiability
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High Quality Test Pattern Generation and Boolean Satisfiability

130,00 €
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-based ATPG framework.
Upplaga
2012 ed.
ISBN
9781489988478
Språk
Engelska
Vikt
310 gram
Utgivningsdatum
2014-10-20
Sidor
193