
Fundamentals of Nanoscale Film Analysis
The book describes the fundamentals of materials characterization from the standpoint of the incident photons or particles which interrogate nanoscale structures.
- Författare
- Terry L. Alford, L.C. Feldman, James W. Mayer
- Upplaga
- 2007 ed.
- ISBN
- 9780387292601
- Språk
- Engelska
- Vikt
- 446 gram
- Utgivningsdatum
- 2007-02-16
- Sidor
- 336