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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

Författare:
inbunden, 2012
Engelska
Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor.
Undertitel
A User-Oriented Guide
Upplaga
2013 ed.
ISBN
9783642273803
Språk
Engelska
Vikt
446 gram
Utgivningsdatum
2012-10-25
Sidor
528