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CTL for Test Information of Digital ICs
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CTL for Test Information of Digital ICs

Författare:
Engelska
CTL is a language that is used to represent test information. The proposed standard IEEE 1450.6 namely the Core Test Language (CTL) has its beginnings in the IEEE 1500 standardization activity as the language to represent test information about a core.
Författare
Rohit Kapur
Upplaga
Softcover reprint of the original 1st ed. 2003
ISBN
9781475778007
Språk
Engelska
Vikt
310 gram
Utgivningsdatum
26.4.2013
Sidor
173