Sökt på: Serie Frontiers in Electronic Testing
totalt 69 träffar
On-Line Testing for VLSI
Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line …
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial …
Delay Fault Testing for VLSI Circuits
In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would …
Data Mining and Diagnosing IC Fails
This book grew out of an attempt to describe a variety of tools that were developed over a period of years in IBM to analyze Integrated Circuit fail data. The selection presented …
Timing Performance of Nanometer Digital Circuits Under Process Variations
This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-step methodology, …
On-Line Testing for VLSI
Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line …
Digital Timing Measurements
As many circuits and applications now enter the Gigahertz frequency range, accurate digital timing measurements have become crucial in the design, verification, characterization, …
Oscillation-Based Test in Mixed-Signal Circuits
Oscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. …
Design for AT-Speed Test, Diagnosis and Measurement
Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, …
SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. …
Models in Hardware Testing
Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware …
Multi-Chip Module Test Strategies
MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test …