Electrical Overstress (EOS) continues to impact semiconductormanufacturing, semiconductor components and systems as technologiesscale from micro- to nano-electronics. This bookteaches thefundamentals of electrical overstress and how to minimize andmitigate EOS failures. The text provides a clear picture of EOSphenomena, EOS origins, EOS sources, EOS physics, EOS failuremechanisms, and EOS on-chip and system design. It provides anilluminating insight into the sources of EOS in manufacturing, integration of on-chip, and system level EOS protection networks, followed by examples in specific technologies, circuits, and chips.The book is unique in covering the EOS manufacturing issues fromon-chip design and electronic design automation to factory-levelEOS program management in today's modern world.
Look inside for extensive coverage on:
- Fundamentals of electrical overstress, from EOS physics, EOS time scales, safe operating area (SOA), to physicalmodels for EOS phenomena
- EOS sources in today's semiconductor manufacturingenvironment, and EOS program management, handling and EOS auditingprocessing to avoid EOS failures
- EOS failures in both semiconductor devices, circuits andsystem
- Discussion of how to distinguish between EOS events, andelectrostatic discharge (ESD) events (e.g. such as human body model(HBM), charged device model (CDM), cable discharge events (CDM), charged board events (CBE), to system level IEC 61000-4-2 testevents)
- EOS protection on-chip design practices and how theydiffer from ESD protection networks and solutions
- Discussion of EOS system level concerns in printed circuitboards (PCB), and manufacturing equipment
- Examples of EOS issues in state-of-the-art digital, analog andpower technologies including CMOS, LDMOS, and BCD
- EOS design rule checking (DRC), LVS, and ERC electronic designautomation (EDA) and how it is distinct from ESD EDA systems
- EOS testing and qualification techniques, and
- Practical off-chip ESD protection and system level solutions toprovide more robust systems
Electrical Overstress (EOS): Devices, Circuits andSystems is a continuation of the author's series of bookson ESD protection. It is an essential reference and a usefulinsight into the issues that confront modern technology as we enterthe nano-electronic era.