The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.
Scanning Transmission Electron Microscopy of Nanomaterials
av Nobuo Tanaka
Fri frakt for privatpersoner. Sendes innen 5‑7 virkedager.
Du vil kanskje like
Veil. pris 25,-