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CTL for Test Information of Digital ICs
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CTL for Test Information of Digital ICs

Forfatter:
Engelsk
CTL is a language that is used to represent test information. The proposed standard IEEE 1450.6 namely the Core Test Language (CTL) has its beginnings in the IEEE 1500 standardization activity as the language to represent test information about a core.
Forfatter
Rohit Kapur
Opplag
Softcover reprint of the original 1st ed. 2003
ISBN
9781475778007
Språk
Engelsk
Vekt
310 gram
Utgivelsesdato
26.4.2013
Antall sider
173