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CTL for Test Information of Digital ICs
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CTL for Test Information of Digital ICs

CTL is a language that is used to represent test information. The proposed standard IEEE 1450.6 namely the Core Test Language (CTL) has its beginnings in the IEEE 1500 standardization activity as the language to represent test information about a core.
Kirjailija
Rohit Kapur
Painos
Softcover reprint of the original 1st ed. 2003
ISBN
9781475778007
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
26.4.2013
Sivumäärä
173