Hakutulokset: Hakutulos
yhteensä 8 hakutulosta
Secondary Ion Mass Spectrometry
This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a …
A Practical Guide to Transmission Electron Microscopy, Volume II
Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred …
Spectroscopic Ellipsometry
Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer …
The Practice of TOF-SIMS
Time of flight secondary ion mass spectrometry, TOF-SIMS, is a highly surface sensitive analytical technique that provides information about composition with submicron lateral …
A Practical Guide to Transmission Electron Microscopy, Volume 1
Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred …
Raman Spectroscopy, Volume I
The book provides an up-to-date overview of the fast growing area of Raman spectroscopy. The two-volume work describes how analytic methods using Raman spectroscopy allow for the …
X-Ray Fluorescence Spectrometry and Its Applications to Archaeology
This book serves as a practical guide for applications of X-ray fluorescence spectrometry, a nondestructive elemental analysis technique, to the study and understanding of …
Auger Electron Spectroscopy
This book discusses the use of Auger electron spectroscopy (AES) and scanning Auger microscopy for the characterization of a wide range of technological materials, including, …