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X-ray absorption fine structure (XAFS) is a powerful technique in characterization of structures and electronic states of materials in many research fields including, e.g., …
Most of the books on infrared characterization are for applications in chemistry and no book has been dedicated to infrared characterization for microelectronics. The focus of the …
This volume comprises papers presented at the 2nd International Conference on Advanced Nondestructive Evaluation (ANDE 2007) held in Busan, Korea, on October 17-19, 2007. Many of …
Ultrasonic methods have been very popular in nondestructive testing and characterization of materials. This book deals with both industrial ultrasound and medical ultrasound. The …
This volume comprises papers presented at the 2nd International Conference on Advanced Nondestructive Evaluation (ANDE 2007) held in Busan, Korea, on October 17-19, 2007. Many of …