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This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While …
This is an overview of different models and mechanisms developed to describe the capture and relaxation of carriers in quantum-dot systems. Despite their undisputed importance, the …
Recent important discoveries and developments in nanotechnology have had a remarkable and ever-increasing impact on many industries, especially materials science, pharmaceuticals, …
In the last few years, several "bottom-up" and "top-down" synthesis routes have been developed to produce tailored hybrid nanoparticles (HNPs). This book provides a new insight …
Hyperbolic metamaterials were originally introduced to overcome the diffraction limit of optical imaging. Soon thereafter it was realized that hyperbolic metamaterials demonstrate …
This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn …
It is generally acknowledged that modeling and simulation are preferred alternatives to trial and error approaches to semiconductor fabrication in the present environment, where …
The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure …
The ability to arrange precisely designed patterns of nanoparticles into a desired spatial configuration is the key to creating novel nanoscale devices that take advantage of the …
This book provides a broad introductory survey of this remarkable field, aiming to establish and clearly differentiate its physical principles, and also to provide a snapshot …